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주사탐침현미경

상담·문의하기

Atomic Force Microscope

  • 모델명 Dimension Edge AFM
  • 제조사 Bruker
  • 장비용도 계측
  • 장비구분 광학/전자영상장비 > 현미경 > 주사탐침현미경

상세정보

구축일자 2010-09-17
납품업체 Bruker
위치 광주광역시 북구 첨단과기로 123 신재생에너지연구동 광주과학기술원 신재생에너지연구동 F5 502
구성및성능 The Dimension Edge™ Atomic Force Microscope (AFM) System offers streamlined access to top AFM performance representing a new level of productivity and attainability for the most advanced nanoscale research.
장비안내 The Dimension Edge™ Atomic Force Microscope (AFM) System offers streamlined access to top AFM performance representing a new level of productivity and attainability for the most advanced nanoscale research. It leverages the many innovations of the Dimension Icon System to provide levels of performance and functionality only available from Bruker. Designed from top to bottom to deliver the low drift and low noise necessary to achieve publication-ready data in minutes instead of hours you won’t find a more powerful mid-priced AFM anywhere else.

Best Value Closed-Loop Dimension AFM
Proprietary sensor design achieves closed-loop accuracy with open-loop noise levels
Reduced noise and drift bring small-sample imaging performance to large-sample AFM
Microscope and electronics design enable high image fidelity at moderate cost
Accurate High-Resolution Results Even Faster
Linear workflow with visual feedback ensure optimized setup in shortest time
Camera and stage provide best sample navigation and multi-site mea

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